WWW.4DIMENSIONS.COM

We provide four point probes with an extended measurement range or sophisticated probing for compound semiconductors. Our latest innovation is a Modified four point probe for measuring pn junction leakage and sheet resistivity in the same probing step meeting the requirements for ultra shallow junction probing... Our CVmap systems perform capacitance-voltage ( CV ) and current-voltage ( IV ) measurements directly on the unmetalized wafer using a uniquely designed Mercury probe... We offer the widest range of Mercury probe geomertries and special capacitance measurement electronics. This permits our systems to probe and characterize a wide range of materials, including semi-conductors, oxides, dielectrics, SOI ( silicon on insulator ), and films on conducting or insulating substrates.

Primary location: Hayward United States