CMI

The nanometrology is a fast developing branch of metrology - a measurement science. Contrary to majority of typical metrological disciplines the nanometrology deals not only with a single physical quantity but tries to handle issues related to the measurement of different quantities with a high lateral resolution typically on the order of nanometers. This effort often brings the need for a measurement of these quantities with a high accuracy and very small absolute values... The Department of Nanometrology was founded in 2006 in the Regional branch Brno of the Czech Metrology Institute and tries to deal with the research as well as with the offer of services in the field of measurement of different physical quantities in very high resolution. You can find on these pages a summary of various measurement methods used in nanometrology, a description of research activities of CMI in this domain, a list of available services, links to open source software and also a list of publications..

Also known as: nanometrology

Primary location: Brno