APPLIED RELAY TESTING - Key Persons
Stuart J. Hobday graduated from Bournemouth University, in 1999 with a BEng (Hons) in Microelectronics and Computing. He has worked for Applied Relay Testing since leaving University, specialising in microprocessors, VLSI and software design and became a Director in August 2013.
David Foster's background includes banking, industrial finance, sales and manufacturing. David brought a wealth of experience with a broad range of organisations to Applied Relay Testing Ltd when he joined in 2013.
David Palmer graduated from University College London in 1985 with a BSc (Hons) in Electronic Engineering. He worked in the Advanced Telecommunications department at the STC research laboratories in Harlow designing second generation digital phones (CT2) and subsequently moved to Dorset to work at Deltest Systems Ltd on Automated Test Equipment design. In 1992 he joined Applied Relay Testing Ltd where he has been involved in the hardware design of relay and connector test equipment and became a Director in 2008.
Sam brings to the team a diverse range of experience in hardware, software and FPGA design with a broad ranging career covering all aspects of electronics design, specialising in the digital domain. Having spent nearly 10 years as a Field Applications Engineer with some of the world's largest semiconductor distributors, Sam also has a vast sales and marketing experience within the electronics industry. He joined Applied Relay Testing in 2019.