EBSD is a well-established accessory for the SEM, which is used for characterising microstructure. The data collected with EBSD are spatially distributed and can be visualised in maps and images, enabling detailed examination of localised features in heterogeneous samples. EBSD is a highly automated technique with modern commercial systems capable of analysing many 1000s of diffraction patterns every second: this makes it possible to scan, with high spatial resolution, across the surface of a sample and to collect all the necessary data for a full microstructural characterisation...
Discover Electron Backscatter Diffraction (EBSD) in this educational site, where we provide a comprehensive overview of the technique for all levels of user.
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