IONTOF

With the Q Exactive TM extension for the M6, IONTOF provides the first commercial SIMS instrument which combines the highest mass resolution (> 240,000) and highest mass accuracy (< 1 ppm) with high resolution cluster SIMS imaging. The powerful combination of the gas cluster ion source and the Orbitrap TM analyzer enables the distinction of different features even in highly complex organic samples... For analytical service IONTOF USA works in a close cooperation with Tascon USA, specialized in analytical service... With the Qtac IONTOF offers a high sensitivity Low Energy Ion Scattering (LEIS) instrument. The extreme surface sensitivity of LEIS makes the Qtac the perfect instrument to study surface processes in many production and research areas on materials such as catalysts, semiconductors, metals, polymers, and fuel cells.

Also known as: ION-TOF USA, Inc., IONTOF GmbH, IONTOF USA

Primary location: Chestnut Ridge United States