SWEEPME

Control your instruments, automate your measurements, and analyze your data with SweepMe! - a multi-tool measurement software. You can create procedures in short time via drag&drop of modules in a tree-like sequencer tool. Any instrument can be added via an open interface by using the Python programming language. Drivers of already implemented devices are used and shared across all users... The on-wafer characterization of multiple dies and subsites is a standard task in semiconductor industry. Often, many instruments have to be combined, such as parameter analyzers, SMUs, or network analyzers. To allow measurements of a device with different instruments, a switching matrix is used... Standard key parameters like open-circuit voltage (Voc), short-circuit current (Isc), max. power point (Mpp), or fill factor (FF) can be retrieved by measuring current-voltage characteristics under standard illumination. Furthermore, the external quantum efficiency at different wavelengths is essential..

Primary location: Dresden Germany