SCIENTIFIC COMPUTING INTERNATIONAL

To meet these demands, our expanding technology suite of multi-modal metrology systems includes multi-angle spectroscopic ellipsometry, polarized reflectometry, transmission, and scatterometry. Our complete product portfolio serves our clients throughout the entire product life cycle, from research and development to high-volume production. We are dedicated to building custom solutions, as needed, to solve your specific requirements... SCI's expanding technology portfolio is focused on meeting tomorrow's most critical metrology needs. To meet these demands, SCI engineers multi-modal metrology solutions, encompassing multi-angle spectroscopic ellipsometry, reflectometry, transmission, and scatterometry. We are dedicated to building custom solutions to solve our customers' most pressing challenges... Combines spectroscopic ellipsometry and DUV multi-angle polarized reflectometry with a wide spectral range to deliver the highest accuracy, precision, and versatility in the industry...

Also known as: spectroscopic ellipsometry

Primary location: Shanghai P.r.c.