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Based on prototypes of such magnetometers, application-specific, cost-effective, complete measuring systems are to be developed. The two measuring methods are complementary with regard to highest spatial resolution and extreme sensitivity, so that different new applications can be developed as a result. With such novel quantum magnetometers, micro- and nanoelectronic components, for example, can be non-destructively tested and then optimized. Even individual bits in storage media could be visualized. In addition, we want to test and establish process nuclear magnetic resonance for chemical process analysis as well as scattered magnetic field measurement for contactless material testing.

Primary location: Freiburg Chile