KLA

Dimensional wafer metrology systems from MicroSense offer precise, non-contact, automated geometry measurements including Thickness, TTV, BOW, WARP, LTV, 2D and 3D mapping on a wide range of substrates including Sapphire, Silicon, SiC, GaAs, Glass, Quartz, Ceramics and Graphene. For measurement and control of multilayer bonded wafers, our systems can measure total wafer stacks and individual layers throughout the wafer bonding, thinning, and de-bonding process steps... MicroSense provides customers with state-of-the art performance in our products - precision capacitive position sensors and vibrating sample magnetometers... With our team of world class experts in magnetic property measurement, MicroSense is the leading supplier of high sensitivity Vibrating Sample Magnetometers for magnetic measurement. Our vibrating sample magnetometers are available in several models with a variety of capabilities, field ranges, resolutions and options. Our VSM systems are used for fundamental..

Also known as: KLA Corporation

Primary location: Lowell United States